With mixers operating at increasingly higher RF and IF frequencies, instrument stability
becomes increasingly more important. In order to understand, and quantify,
the different noise mechanism's involved, we employ a technique first
described by D.W. Allan (1) and ellaborated upon by R. Schieder(2).
1.D. W. Allan, "Statistics of Atomic Frequency Standards",
2. R. Schieder, "Characterization and Measurment of System Stability",
Example of a Quasi-optical Mixer
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HEB Stability vs Bias
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Measurement Setup
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R. Schieder and C. Kramer
J.W. Kooi, G. Chattopadhyay, M. Thielman, T.G. Phillips, and R. Schieder
T. Berg, S. Cherednichenko, V. Drakinskiy, P. Khosropanah, H. Merkel, E. Kollberg, and J. Kooi
| Receiver Index | CSO | SMA | NRAO | Submm Physics Homepage | ALMA Band 9 Cartridge | Caltech Astronomy | Web Page created and last updated on Dec. 28, 2005, by: Jacob W. Kooi |